Dr. Huiwen Liu
at The Ohio State Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Microelectromechanical systems, Molecules, Interfaces, Reliability, Resistance, Atomic force microscopy, Micromirrors, Digital micromirror devices, Adhesives, Self-assembled monolayers

PROCEEDINGS ARTICLE | December 23, 2003
Proc. SPIE. 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III
KEYWORDS: Microelectromechanical systems, Molecules, Interfaces, Reliability, Resistance, Atomic force microscopy, Micromirrors, Digital micromirror devices, Adhesives, Self-assembled monolayers

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