Dr. Huiying Ye
Professor at Zhengzhou Univ
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 6 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Statistical analysis, Optical spheres, Cameras, Image processing, Error analysis, Reliability, Image analysis, 3D metrology, Data centers, Structured light

Proceedings Article | 18 November 2014 Paper
Proc. SPIE. 9267, Semiconductor Lasers and Applications VI
KEYWORDS: Complex systems, Laser applications, Reflectivity, Numerical simulations, Semiconductor lasers, Nonlinear optics, Differential equations, Laser optics, Stereolithography, Systems modeling

Proceedings Article | 11 November 2010 Paper
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Sensors, Digital filtering, Denoising, Interferometry, Field programmable gate arrays, Signal processing, Sensing systems, Signal detection, Filtering (signal processing), Bandpass filters

Proceedings Article | 11 November 2010 Paper
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Target detection, Detection and tracking algorithms, Modulation, Sensors, Computing systems, Interferometry, Computer simulations, Semiconductor lasers, Sensing systems, Reconstruction algorithms

Proceedings Article | 20 January 2006 Paper
Proc. SPIE. 6027, ICO20: Optical Information Processing
KEYWORDS: Refractive index, Magnesium, Data modeling, Modulation, Reflectivity, Interferometry, Phase interferometry, Semiconductor lasers, Stereolithography, Light

Showing 5 of 6 publications
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