Prof. Hung-Lin Hsieh
Associate Professor at National Taiwan Univ. of Science and Technology
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Photodetectors, Mirrors, Phase modulation, Modulation, Polarization, Interferometers, Sensors, Interferometry, Phase shift keying, Heterodyning, Scanning probe microscopy, Phase measurement, Signal detection, Diffraction gratings

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Wafer-level optics, Light sources, Moire patterns, Light emitting diodes, Sensors, Manufacturing, CCD cameras, Collimation, Profiling, Light sources and illumination, Epitaxy, Metalorganic chemical vapor deposition, Semiconducting wafers, Wafer testing, Phase shifts

PROCEEDINGS ARTICLE | September 20, 2013
Proc. SPIE. 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
KEYWORDS: Interferometers, Sensors, Laser development, Interferometry, Computer programming, Optical testing, Heterodyning, Precision measurement, Laser stabilization, Signal detection

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