Prof. Huub M.W. Salemink
Professor at Radboud Univ Nijmegen
SPIE Involvement:
Author
Publications (13)

PROCEEDINGS ARTICLE | April 25, 2012
Proc. SPIE. 8425, Photonic Crystal Materials and Devices X
KEYWORDS: Semiconductors, Photodetectors, Refractive index, Waveguides, Sensors, Photons, Crystals, Silicon, Photonic crystals, Microelectronics

PROCEEDINGS ARTICLE | February 28, 2012
Proc. SPIE. 8262, Gallium Nitride Materials and Devices VII
KEYWORDS: Semiconductors, Refractive index, Tunable lasers, Quantum wells, Electrons, Semiconductor lasers, Ocean optics, Gallium nitride, Thermal effects, Temperature metrology

PROCEEDINGS ARTICLE | May 13, 2010
Proc. SPIE. 7713, Photonic Crystal Materials and Devices IX
KEYWORDS: Semiconductors, Refractive index, Indium arsenide, Thermal optics, Photonic crystals, Quantum dots, Liquid crystals, Nanocrystals, Temperature metrology, Liquids

PROCEEDINGS ARTICLE | April 2, 2010
Proc. SPIE. 7638, Metrology, Inspection, and Process Control for Microlithography XXIV
KEYWORDS: Electron beam lithography, Polymers, Ions, Inspection, Scanning helium ion microscopy, Ion beams, Helium, Nanofabrication, Ion beam lithography, Nanolithography

PROCEEDINGS ARTICLE | February 24, 2010
Proc. SPIE. 7609, Photonic and Phononic Crystal Materials and Devices X
KEYWORDS: Mirrors, Beam splitters, Mach-Zehnder interferometers, Waveguides, Silicon, Photonic crystals, Modulators, Collimation, Light wave propagation, Phase shifts

PROCEEDINGS ARTICLE | February 14, 2009
Proc. SPIE. 7223, Photonic and Phononic Crystal Materials and Devices IX
KEYWORDS: Refractive index, Waveguides, Cladding, Etching, Light scattering, Scanning electron microscopy, Near field scanning optical microscopy, Liquid crystals, Planar waveguides, Photonic integrated circuits

Showing 5 of 13 publications
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