Hye-Kyoung Lee
at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 63490C (2006) https://doi.org/10.1117/12.686839
KEYWORDS: Quartz, Etching, Photomasks, Chromium, Dry etching, Nanoimprint lithography, Resolution enhancement technologies, Critical dimension metrology, Electroluminescence, Lithography

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