Hye-Won Kim
at Seoul National Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 26, 2008
Proc. SPIE. 6813, Image Processing: Machine Vision Applications
KEYWORDS: Thin films, Defect detection, Sensors, Image segmentation, Image processing, Inspection, Process control, Signal detection, Array processing, Defect inspection

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