Hyo Jung Roh
at Dongjin Semichem Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 April 2011 Paper
Proceedings Volume 7972, 79721Q (2011) https://doi.org/10.1117/12.879581
KEYWORDS: Photoresist materials, Polymers, Photoresist developing, Critical dimension metrology, Bottom antireflective coatings, Lithography, Reflectivity, Double patterning technology, Etching, Temperature metrology

Proceedings Article | 26 March 2008 Paper
Proceedings Volume 6923, 69232T (2008) https://doi.org/10.1117/12.776801
KEYWORDS: Reflectivity, Etching, Refractive index, Semiconductors, Photoresist processing, Polymers, Lithography, Photorefractive polymers, Photoresist materials, Materials processing

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