Dr. Hyun Jong Kim
at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 October 2004
Proc. SPIE. 5546, Imaging Spectrometry X
KEYWORDS: Thin films, Ellipsometry, Spectrographs, Polarization, Sensors, Calibration, Spectroscopy, Imaging spectroscopy, Optical testing, Signal detection

Proceedings Article | 14 October 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Thin films, Refractive index, Titanium dioxide, Optical properties, Dispersion, Crystals, Silicon, Silicon films, Spectroscopic ellipsometry, Thin film growth

Proceedings Article | 1 July 2003
Proc. SPIE. 4999, Quantum Sensing: Evolution and Revolution from Past to Future
KEYWORDS: Semiconductors, Thin films, Ellipsometry, Ultraviolet radiation, Crystals, Interfaces, Silicon, Diffusion, Microwave radiation, Pulsed laser operation

Proceedings Article | 21 May 2002
Proc. SPIE. 4650, Photodetector Materials and Devices VII
KEYWORDS: Semiconductors, Thin films, Ellipsometry, Crystals, Interfaces, Silicon, Diffusion, Silicon films, Microwave radiation, Pulsed laser operation

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