Hyun-Seung Lee
at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 24, 2011
Proc. SPIE. 7867, Image Quality and System Performance VIII
KEYWORDS: Super resolution, Statistical analysis, Visualization, Image restoration, Image quality, Color difference, Reconstruction algorithms, Lawrencium, Image quality standards, Berkelium

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