Dr. Hyung-Kun Kim
at SAMSUNG Electro-Mechanics
SPIE Involvement:
Publications (6)

Proceedings Article | 12 February 2010
Proc. SPIE. 7617, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIV
KEYWORDS: Light emitting diodes, Silicon, Particles, Luminous efficiency, Absorption, LED lighting, Reflectors, Reflectivity, Packaging, Refractive index

Proceedings Article | 6 October 2006
Proc. SPIE. 6352, Optoelectronic Materials and Devices
KEYWORDS: Quantum wells, Indium gallium nitride, Aluminum, Temperature metrology, Gallium nitride, Semiconductor lasers, Superlattices, Near field optics, Continuous wave operation

Proceedings Article | 3 March 2006
Proc. SPIE. 6121, Gallium Nitride Materials and Devices
KEYWORDS: Semiconductor lasers, Sapphire, Temperature metrology, Light sources, Indium gallium nitride, Waveguide lasers, Waveguides, Metalorganic chemical vapor deposition, Gallium nitride, Aluminum nitride

Proceedings Article | 23 August 2000
Proc. SPIE. 4182, Process Control and Diagnostics
KEYWORDS: Resistance, Adhesives, Reliability, Particles, Copper, Silver, Glasses, Metals, Scanning electron microscopy, Temperature metrology

Proceedings Article | 18 August 2000
Proc. SPIE. 4181, Challenges in Process Integration and Device Technology
KEYWORDS: Dielectrics, Polymer thin films, Refractive index, Optical spectroscopy

Proceedings Article | 11 August 1999
Proc. SPIE. 3883, Multilevel Interconnect Technology III
KEYWORDS: Polymer thin films, Polymers, Polymethylmethacrylate, Glasses, Thin films, Picosecond phenomena, Data modeling, Refractive index, Dielectrics, Silicon

Showing 5 of 6 publications
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