Dr. Ian Chequer
at Teledyne e2v UK Ltd
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 3 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182207 (2021) https://doi.org/10.1117/12.2594234
KEYWORDS: Coating, Mirrors, Silicon, Semiconducting wafers, Photoresist materials, Optics manufacturing, Reflectivity, Inspection, Photography, Packaging

Proceedings Article | 11 June 2021 Open Access Presentation + Paper
Proceedings Volume 11852, 118521Z (2021) https://doi.org/10.1117/12.2599339

Proceedings Article | 30 October 2019 Presentation + Paper
Proceedings Volume 11119, 111190E (2019) https://doi.org/10.1117/12.2530941
KEYWORDS: Mirrors, Silicon, Manufacturing, X-ray optics, Optics manufacturing, X-rays, Semiconducting wafers, Reflectivity, Metals

Proceedings Article | 12 September 2019 Paper
Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoeckx, Ljubiša Babić, Laurens Keek, David Girou, Ben Okma, Enrico Hauser, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Ronald Start, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Paul Hieltjes, Jan Willem den Herder, Peter Müller, Evelyn Handick, Michael Krumrey, Miranda Bradshaw, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Sara Svendsen, Desirée Della Monica Ferreira, Finn Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball
Proceedings Volume 11119, 111190L (2019) https://doi.org/10.1117/12.2530696
KEYWORDS: Silicon, Wafer-level optics, X-ray optics, Semiconducting wafers, Lightweight mirrors, Mirrors, X-ray telescopes, Spatial resolution, Gamma radiation, Biomedical optics

Proceedings Article | 12 July 2019 Open Access Paper
Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, Dervis Vernani
Proceedings Volume 11180, 1118023 (2019) https://doi.org/10.1117/12.2535994
KEYWORDS: Mirrors, Silicon, X-rays, Coating, Reflectivity, X-ray optics, Semiconducting wafers, Spatial resolution, Robots, Coating equipment

Showing 5 of 6 publications
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