Mr. Ian Lacey
Sr. Scientific Engineering Associate at LBNL
Area of Expertise:
precision measurement , atomic spectroscopy , x-ray optics , metrology , data analysis
Publications (10)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Prisms, X-ray optics, Metrology, X-ray sources, Interferometry, Optical metrology, Synchrotrons, Free electron lasers, Coherent x-ray sources

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Mirrors, Light sources, X-ray optics, Metrology, Nano opto mechanical systems, Calibration, Interferometry, Synchrotron radiation, Light

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Microscopes, X-ray optics, Metrology, Calibration, Interferometry, Optical metrology, Optics manufacturing, Data analysis

SPIE Journal Paper | October 12, 2015
OE Vol. 54 Issue 10
KEYWORDS: Metrology, X-ray optics, Control systems, Mirrors, Humidity, X-rays, Temperature metrology, Interferometry, Calibration, Particles

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical microscopes, Spatial frequencies, Sensors, Calibration, Error analysis, Silicon, Optical fabrication, Modulation transfer functions, Binary data, Standards development

PROCEEDINGS ARTICLE | September 17, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Mirrors, Light sources, X-ray optics, Metrology, Optical spheres, Calibration, Optical testing, Autocollimators, Spherical lenses, Precision calibration

Showing 5 of 10 publications
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