Ian Lacey
Sr. Scientific Engineering Associate at Lawrence Berkeley National Lab
Area of Expertise:
precision measurement , atomic spectroscopy , x-ray optics , metrology , data analysis
Publications (22)

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Mirrors, Spatial resolution, Light sources, Light, Point spread functions, Metrology, Diffraction gratings, Optical sensors, X-rays

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Diffraction gratings, Diffraction, Error analysis, Data processing, Light sources, Spatial resolution, X-ray diffraction

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11493, Advances in Computational Methods for X-Ray Optics V
KEYWORDS: Aspheric optics, Mirrors, Shape analysis, X-rays, Optical simulations, Light sources, X-ray optics, Data modeling, Ray tracing, Grazing incidence

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Distortion, Sensors, Mirrors, Calibration, Lens design, Coating, Wavefronts, Glasses, Optical beam profilers, X-ray optics

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11490, Interferometry XX
KEYWORDS: Modulation transfer functions, Fizeau interferometers, Calibration, Light sources, Interferometers, Spatial frequencies, Metrology, Zoom lenses, Binary data

Showing 5 of 22 publications
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