Ian Lacey
Sr. Scientific Engineering Associate at Lawrence Berkeley National Lab
Area of Expertise:
precision measurement , atomic spectroscopy , x-ray optics , metrology , data analysis
Publications (17)

Proceedings Article | 2 October 2019
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Calibration, Error analysis, X-rays, Autocollimators, Profilometers, Precision calibration

Proceedings Article | 9 September 2019
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Point spread functions, Mirrors, X-ray optics, Metrology, Spatial frequencies, Sensors, Calibration, Beam shaping, Spatial resolution

Proceedings Article | 18 September 2018
Proc. SPIE. 10761, Adaptive X-Ray Optics V
KEYWORDS: Mirrors, X-ray optics, Metrology, Error analysis, X-rays, Software development, Geometrical optics, Algorithm development, Optimization (mathematics), Grazing incidence

Proceedings Article | 17 September 2018
Proc. SPIE. 10760, Advances in X-Ray/EUV Optics and Components XIII
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Calibration, X-rays, Gaussian filters, Autocollimators

Proceedings Article | 18 August 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Monochromatic aberrations, Visualization, Spatial frequencies, Interferometers, Modulation transfer functions, Fizeau interferometers

Showing 5 of 17 publications
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