Ichiro Fujimura
at Keio Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 16, 2012
Proc. SPIE. 8243, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVII
KEYWORDS: Refractive index, Femtosecond phenomena, Optical lithography, Optical spheres, Dielectrics, Silicon, Near field, Nanolithography, Dielectric polarization, Near field optics

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