Dr. Ichiro Ogura
at AIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2000
Proc. SPIE. 4222, Process Control and Inspection for Industry
KEYWORDS: Spindles, Spatial frequencies, Sensors, Error analysis, Manufacturing, Time metrology, Optical resolution, Aluminum, Motion measurement, Precision diamond machining

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