Dr. Idoia Freijo-Martín
at European XFEL GmbH
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Interferometry, X-rays, Photons, Femtosecond phenomena, Steiner quadruple pulse system, Spectroscopy, Laser scattering, Scattering, Mirrors, Photovoltaics

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Mirrors, Metrology, Polishing, X-rays, Femtosecond phenomena, Photons, Surface finishing, Cooling systems, Coating, Grazing incidence

PROCEEDINGS ARTICLE | June 14, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, Diffraction, Free electron lasers, X-ray sources, X-ray optics, Interferometry, Polishing, Surface finishing, Metrology, Adaptive optics

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, Interferometry, X-rays, Grazing incidence, Calibration, Interferometry, X-rays, Metrology, X-ray optics, Inspection, Wavefronts, Optical components

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Mirrors, X-rays, X-ray characterization, Control systems, Fizeau interferometers, Sensors, Mirrors, Fizeau interferometers, Sensors, X-ray characterization, Actuators, Calibration, Temperature metrology, Silicon

PROCEEDINGS ARTICLE | June 21, 2015
Proc. SPIE. 9526, Modeling Aspects in Optical Metrology V
KEYWORDS: Mirrors, X-rays, Metrology, Grazing incidence, Wavefronts, Linear filtering, Optical filters, Electronic filtering, Fizeau interferometers, Interferometry

Showing 5 of 6 publications
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