Dr. Igor Dunin-Barkowski
CTO at Synapse Imaging Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 October 2006 Paper
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Imaging systems, Cameras, Inspection, Receivers, 3D metrology, Projection systems, Machine vision, 3D vision, 3D image processing, Phase shifts

Proceedings Article | 6 December 2005 Paper
Proc. SPIE. 6051, Optomechatronic Machine Vision
KEYWORDS: Semiconductors, Manufacturing, Inspection, 3D metrology, Projection systems, Wafer inspection, Phase measurement, Semiconducting wafers, 3D image processing, Phase shifts

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