Dr. Igor Dunin-Barkowski
CTO at Synapse Imaging Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 October 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: 3D metrology, Phase shifts, Projection systems, Receivers, Inspection, Imaging systems, 3D vision, Machine vision, Cameras, 3D image processing

Proceedings Article | 6 December 2005
Proc. SPIE. 6051, Optomechatronic Machine Vision
KEYWORDS: Inspection, Phase shifts, 3D metrology, 3D image processing, Phase measurement, Manufacturing, Wafer inspection, Projection systems, Semiconducting wafers, Semiconductors

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