Igor Vainshtein
at RICOR Cryogenic & Vacuum Systems
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 7 May 2019
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Thermography, Sensors, Interfaces, Manufacturing, Connectors, Acoustics, Temperature metrology

Proceedings Article | 9 May 2018
Proc. SPIE. 10626, Tri-Technology Device Refrigeration (TTDR) III
KEYWORDS: Staring arrays, Accelerated life testing, Data modeling, Reliability, Surveillance, Frequency modulation, Fermium, Failure analysis, Cryocoolers, Thermal modeling

Proceedings Article | 5 May 2017
Proc. SPIE. 10180, Tri-Technology Device Refrigeration (TTDR) II
KEYWORDS: Staring arrays, Sensors, Copper, Reliability, Head, Medium wave, Environmental sensing, Cryocoolers, Systems modeling, Temperature metrology

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