Ikuo Fujiwara
at Toshiba Corp
SPIE Involvement:
Publications (5)

Proceedings Article | 4 March 2019
Proc. SPIE. 10921, Integrated Optics: Devices, Materials, and Technologies XXIII
KEYWORDS: Silicon, LIDAR, Measurement devices, Optical sensors, Silicon photomultipliers, Electrodes, Absorption, Temperature metrology, Photodetectors, Diffusion

Proceedings Article | 11 June 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Amplifiers, Infrared radiation, Cadmium sulfide, Readout integrated circuits, Thermography, Sensors, Staring arrays, Diodes, Infrared sensors, Infrared imaging

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Diodes, CMOS technology, Thermography, Infrared detection, Silicon, Absorption, Infrared technology, Thermoelectric materials, Infrared radiation, Infrared imaging

Proceedings Article | 4 May 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Signal to noise ratio, Diodes, Silicon, Field effect transistors, Sensors, Staring arrays, Infrared radiation, Capacitors, Algorithm development, Thermography

Proceedings Article | 7 May 2009
Proc. SPIE. 7298, Infrared Technology and Applications XXXV
KEYWORDS: Sensors, Amplifiers, Silicon, Infrared radiation, Staring arrays, Infrared detection, Diodes, Ceramics, Cameras, Thermography

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