Dr. Ilan Ha Bloom
at Saifun Semiconductors
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 9, 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Oxides, Switches, Oscillators, Metals, Electrons, Silicon, Silver, Resistance, Interference (communication), Resistors

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