Dr. Ilan Ha Bloom
at Saifun Semiconductors
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 May 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Oxides, Silicon, Electrons, Interference (communication), Silver, Metals, Resistance, Switches, Resistors, Oscillators

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