Dr. Insu Jeon
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 17, 2017
Proc. SPIE. 10341, Ninth International Conference on Machine Vision (ICMV 2016)
KEYWORDS: Visual process modeling, Defect detection, Data modeling, Organic light emitting diodes, Inspection, Computer science, Motion models, Statistical modeling, Fuzzy logic, Data analysis

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top