Mr. Ioannis Kontoyiannis Profile

Ioannis Kontoyiannis

at Univ. of Cambridge

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 26 March 2019 Paper

Denoising line edge roughness measurement using hidden Markov models

George Papavieros, Ioannis Kontoyiannis, Vassilios Constantoudis, Evangelos Gogolides

Proceedings Volume 10959, 109592Z (2019) https://doi.org/10.1117/12.2523422

KEYWORDS: Data modeling, Line edge roughness, Denoising, Matrices, Scanning electron microscopy, Edge detection, Machine learning, Image processing, Detection and tracking algorithms, Algorithm development

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years