Dr. Iosu Cendoya
at Univ de Navarra
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 30, 2005
Proc. SPIE. 5837, VLSI Circuits and Systems II
KEYWORDS: Oxides, Metals, Silicon, Resistance, Magnetism, Quality measurement, Integrated circuits, CMOS technology, Local area networks, Inductance

PROCEEDINGS ARTICLE | June 30, 2005
Proc. SPIE. 5837, VLSI Circuits and Systems II
KEYWORDS: Signal attenuation, Metals, Digital filtering, Manufacturing, Linear filtering, Capacitance, Image filtering, Electromagnetic coupling, Inductance, Standards development

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