Dr. Iris Erichsen Profile

Dr. Iris Erichsen

at TRIOPTICS GmbH

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 7 February 2012

Surface topography and optical performance measurement of microlenses used in high power VCSEL systems

I. Erichsen, S. Krey

Proc. SPIE. 8276, Vertical-Cavity Surface-Emitting Lasers XVI

KEYWORDS: Wavefronts, Microlens, Wavefront sensors, Lenses, Sensors, Vertical cavity surface emitting lasers, Microlens array, Reflection, Optics manufacturing, Optical properties

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Proceedings Article | 14 May 2010

A deflectometric sensor for the on-machine surface form measurement and adaptive manufacturing

Stefan Krey, Iris Erichsen, Ilka Mahns, Wim van Amstel, Karl Vielhaber

Proc. SPIE. 7718, Optical Micro- and Nanometrology III

KEYWORDS: Sensors, Manufacturing, Aspheric lenses, Spherical lenses, Optical spheres, Deflectometry, Error analysis, Optics manufacturing, Kinematics, Reconstruction algorithms

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Proceedings Article | 24 February 2010

Characterization of intraocular lenses: a comparison of different measurement methods

M. Cherrier, I. Erichsen, S. Krey

Proc. SPIE. 7556, Design and Quality for Biomedical Technologies III

KEYWORDS: Modulation transfer functions, Wavefronts, Eye, Eye models, Monochromatic aberrations, Cornea, Intraocular lenses, Wavefront sensors, CCD cameras, Point spread functions

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Proceedings Article | 29 August 2008

High resolution wavefront measurement of aspheric optics

I. Erichsen, S. Krey, J. Heinisch, A. Ruprecht, E. Dumitrescu

Proc. SPIE. 7060, Current Developments in Lens Design and Optical Engineering IX

KEYWORDS: Wavefronts, Semiconducting wafers, Wavefront sensors, Sensors, Light sources, Optical testing, Modulation transfer functions, Wafer-level optics, Aspheric optics, Aspheric lenses

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Proceedings Article | 25 April 2008

Ultra-fast wavefront analyser for high volume production of camera modules lenses

M. Cherrier, I. Erichsen, A. Ruprecht, S. Krey

Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II

KEYWORDS: Semiconducting wafers, Wavefronts, Lenses, Sensors, Wavefront sensors, Objectives, Telescopes, Light sources, Microscopes, Modulation transfer functions

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Proceedings Article | 14 May 2007

Aspheric lens tester with shack-hartmann sensor

A. Ruprecht, I. Scheele, S. Krey, J. Heinisch

Proc. SPIE. 10316, Optifab 2007: Technical Digest

KEYWORDS: Wavefronts, Sensors, Aspheric lenses, Wavefront sensors, Imaging systems, Modulation transfer functions, Image sensors, Point spread functions, Microlens array, Cameras

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Proceedings Article | 14 May 2007

Measurement of aspheric surfaces with 3D-deflectometry

I. Scheele, S. Krey, J. Heinisch

Proc. SPIE. 10316, Optifab 2007: Technical Digest

KEYWORDS: Aspheric lenses, Sensors, Optical spheres, Spherical lenses, Time metrology, Head, Optical resolution, Metals, Beam splitters, Interferometry

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Showing 5 of 7 publications

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