Isaias D. Job
Imaging Scientist at Varex Imaging Corp
SPIE Involvement:
Publications (12)

Proceedings Article | 16 March 2020 Paper
Proceedings Volume 11312, 113123W (2020)
KEYWORDS: Sensors, Amorphous silicon, Imaging systems, Field emission displays, Modulation transfer functions, Spatial frequencies, CMOS sensors, Signal to noise ratio, Sensor performance, X-rays

Proceedings Article | 3 April 2019 Presentation + Paper
Proceedings Volume 10948, 109480F (2019)
KEYWORDS: Amorphous silicon, Sensors, CMOS sensors, Scintillators, X-rays, Modulation transfer functions, Imaging systems, X-ray imaging

Proceedings Article | 1 March 2019 Paper
Steve Wettstein, Carlo Tognina, Isaias Job
Proceedings Volume 10948, 109483F (2019)
KEYWORDS: Imaging systems, Signal to noise ratio, Mammography, Tomography, X-rays, Sensors, Modulation transfer functions

Proceedings Article | 31 March 2016 Paper
Proceedings Volume 9783, 97833T (2016)
KEYWORDS: Sensors, Modulation transfer functions, Image sensors, Image quality, Data acquisition, Signal to noise ratio, Field emission displays, X-rays, X-ray imaging, Quantum electronics, Calibration, Image processing, Interference (communication), X-ray detectors

Proceedings Article | 3 March 2012 Paper
Isaias Job, Nima Taie-Nobraie, Richard Colbeth, Ivan Mollov, Keith Gray, Chris Webb, John Pavkovich, Fred Zoghi, Carlo Tognina, Pieter Roos
Proceedings Volume 8313, 83135T (2012)
KEYWORDS: Scintillators, X-rays, Sensors, Modulation transfer functions, Signal to noise ratio, X-ray imaging, Spatial resolution, Molybdenum, Aluminum, Tissues

Showing 5 of 12 publications
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