Dr. Ivan Kassamakov
Ph. D., Researcher at Univ of Helsinki
SPIE Involvement:
Senior status | Author
Publications (36)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Diffraction, Super resolution, Optical spheres, Polymers, Glasses, Interferometry, 3D modeling, Monte Carlo methods, Objectives, Semiconducting wafers

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Microscopes, Diffraction, Finite-difference time-domain method, Super resolution, Optical spheres, Light scattering, Monte Carlo methods, Near field, Objectives, Device simulation

Proceedings Article | 4 March 2019
Proc. SPIE. 10925, Photonic Instrumentation Engineering VI
KEYWORDS: Super resolution, Interferometers, Polymers, Physics, Image resolution, Interferometry, Objectives, 3D image processing, Resolution enhancement technologies, Photonic nanostructures

Proceedings Article | 7 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Metrology, 3D imaging standards, Calibration, Time metrology, Solids, 3D metrology, Neodymium, Standards development, 3D image processing

Proceedings Article | 23 February 2018
Proc. SPIE. 10499, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV
KEYWORDS: Microscopes, Diffraction, Optical transfer functions, Stars, Interferometers, Calibration, Manufacturing, 3D metrology, Objectives, Standards development

Showing 5 of 36 publications
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