Mr. Ivan S. Nekrylov
Engineer at ITMO Univ.
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Reflectors, Photodetectors, Retroreflectors, Light emitting diodes, Cameras, Digital filtering, Complex systems, Control systems, Distortion, Autocollimation, Telecommunications, Machine vision, Optical alignment

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Photodetectors, Optical filters, Light emitting diodes, Cameras, Video, Error analysis, Receivers, Control systems, Optical flow, Infrared radiation, Convection, Atmospheric propagation, Temperature metrology

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10231, Optical Sensors 2017
KEYWORDS: Zemax, Photodetectors, Diffraction, Cameras, Control systems, Optoelectronics, Refraction, Analytical research, Singular optics, Temperature metrology, Channel projecting optics, Diffraction gratings

PROCEEDINGS ARTICLE | April 27, 2016
Proc. SPIE. 9889, Optical Modelling and Design IV
KEYWORDS: Telescopes, Retroreflectors, Interferometers, Digital filtering, Receivers, Control systems, Control systems, Optical testing, Buildings, Collimators, Optoelectronics, Autocollimation, Telecommunications, Satellite communications, Optical alignment, Chemical elements, Electroluminescent displays

PROCEEDINGS ARTICLE | April 27, 2016
Proc. SPIE. 9889, Optical Modelling and Design IV
KEYWORDS: Semiconductors, Refractive index, Light emitting diodes, Optical spheres, Imaging systems, Receivers, Control systems, Ocean optics, Optoelectronics, Turbulence, Solids, Diodes, Optical scanning systems, RGB color model

PROCEEDINGS ARTICLE | April 27, 2016
Proc. SPIE. 9889, Optical Modelling and Design IV
KEYWORDS: Mathematical modeling, Semiconductors, Monochromatic aberrations, Optical design, Light sources, Light emitting diodes, Modulation, Receivers, Optoelectronics, Optoelectronics, Signal processing, Precision measurement, Objectives, Diodes, Channel projecting optics

Showing 5 of 9 publications
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