Ivan S. Nekrylov
Engineer at ITMO Univ
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Photodetectors, Visualization, Cameras, Sensors, Video, Interference (communication), Power supplies, Light sources and illumination, Temperature metrology

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Photodetectors, Diffraction, Point spread functions, Sensors, Spectroscopy, Light sources and illumination, Spectral resolution, Convolution, Diffraction gratings

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Photodetectors, Cameras, Image processing, Error analysis, Receivers, Computer simulations, Optoelectronics, Stereoscopic cameras, Optical tracking

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Photodetectors, Diamond, Particles, Luminescence, Photomultipliers, X-rays, Image registration, Raw materials, Surface conduction electron emitter displays, Channel projecting optics

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Refractive index, Cameras, Error analysis, Digital cameras, Control systems, Image analysis, Image sensors, Active optics, Temperature metrology, RGB color model

Showing 5 of 17 publications
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