Dr. Ivan Zhirnov
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2018 Presentation
Proceedings Volume 10661, 106610C (2018) https://doi.org/10.1117/12.2305002
KEYWORDS: Imaging systems, Radiation thermometry, Temperature metrology, Calibration, Additive manufacturing, Metrology, Stray light, System integration, Pyrometry, Black bodies

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