Dr. Ivan Zhirnov
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10661, Thermosense: Thermal Infrared Applications XL
KEYWORDS: Metrology, Imaging systems, Calibration, Additive manufacturing, Pyrometry, Black bodies, Stray light, Radiation thermometry, System integration, Temperature metrology

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