Jürgen Probst
at Nano Optics Berlin GmbH
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 October 2019
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Diffraction, Diffraction, Mirrors, Optical design, Optical design, Error analysis, Error analysis, X-rays, X-rays, Spectrometers, Ray tracing, Ray tracing, Spectral resolution, Spherical lenses, Diffraction gratings

Proceedings Article | 1 October 2019
Proc. SPIE. 11110, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII
KEYWORDS: Optical components, Mirrors, X-ray optics, Spectroscopy, Luminescence, X-rays, Extreme ultraviolet, Monochromators, Ultrafast laser spectroscopy

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