Dr. J. Scott Price
Physicist/X-Ray Technologist at GE Global Research
SPIE Involvement:
Conference Co-Chair | Conference Program Committee | Editor | Author
Publications (3)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10387, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI
KEYWORDS: Mathematical modeling, Physics

PROCEEDINGS ARTICLE | December 6, 2001
Proc. SPIE. 4502, Advances in Laboratory-based X-Ray Sources and Optics II
KEYWORDS: Signal to noise ratio, Electron beams, X-ray computed tomography, Sensors, Medical diagnostics, X-rays, X-ray sources, Angiography, Mammography, Signal detection

Conference Committee Involvement (4)
Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI
7 August 2017 | San Diego, California, United States
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
30 August 2016 | San Diego, California, United States
Advances in Laboratory-based X-Ray Sources, Optics, and Applications IV
10 August 2015 | San Diego, California, United States
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
4 August 2003 | San Diego, California, United States
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