J. Warren Pickard
Sr Program Manager at Trideum Corp
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | July 13, 1998
Proc. SPIE. 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
KEYWORDS: Weapons, Data modeling, Sensors, Databases, Image processing, Photography, 3D modeling, Volume rendering, Image classification, Hardware in the loop testing

PROCEEDINGS ARTICLE | June 20, 1997
Proc. SPIE. 3062, Targets and Backgrounds: Characterization and Representation III
KEYWORDS: Target detection, Detection and tracking algorithms, Sensors, Image sensors, Infrared signatures, Automatic target recognition, Missiles, Imaging infrared seeker, Thermal modeling, Systems modeling

PROCEEDINGS ARTICLE | June 17, 1996
Proc. SPIE. 2742, Targets and Backgrounds: Characterization and Representation II
KEYWORDS: Data modeling, Databases, Satellites, Image processing, 3D modeling, Satellite imaging, Image classification, Infrared signatures, Missiles, Systems modeling

SPIE Journal Paper | February 1, 1990
OE Vol. 29 Issue 02
KEYWORDS: Spatial frequencies, Target detection, Imaging systems, Visualization, Forward looking infrared, Modulation transfer functions, Human vision and color perception, Electronics, Electro optical systems, Image quality

Conference Committee Involvement (4)
Targets and Backgrounds XII: Characterization and Representation
17 April 2006 | Orlando (Kissimmee), Florida, United States
Targets and Backgrounds XI: Characterization and Representation
28 March 2005 | Orlando, Florida, United States
Targets and Backgrounds X: Characterization and Representation
12 April 2004 | Orlando, Florida, United States
Targets and Backgrounds IX: Characterization and Representation
21 April 2003 | Orlando, Florida, United States
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