Jayson P. Cabanilla
at National Institute of Physics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Fringe analysis, Phase shifting, Calibration, Fourier transforms, Nondestructive evaluation, 3D metrology, Projection systems

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