Dr. John Tsai
President at Excel Precision Corp
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | April 1, 2004
OE Vol. 43 Issue 04
KEYWORDS: Refractive index, Interferometers, Environmental sensing, Mirrors, Laser optics, Beam splitters, Retroreflectors, Receivers, Reflectivity, Optical engineering

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