Jun Liu
at Suzhou Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Image encryption, Data hiding, Fourier transforms, Phase shift keying, Computer programming, Wigner distribution functions, Computer security, Optical image encryption, Cryptanalysis, Optical information security

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