Dr. Jacek Galas Profile

Dr. Jacek Galas

Deputy Director for R&D Services at Institute of Applied Optics

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Author

Publications (30)

Proceedings Article | 14 October 2020 Paper

A fast variable wavelength interferometer

Dariusz Litwin, Kamil Radziak, Jacek Galas

Proc. SPIE. 11581, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2020

KEYWORDS: Wave plates, Interferometers, Prisms, Interferometry, Light sources, Fringe analysis, Time metrology, Quartz, Polarizers

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Proceedings Article | 6 November 2019 Paper

Overview of the measuring systems where a continuously altered light source plays a key role: Part II

Dariusz Litwin, Kamil Radziak, Jacek Galas, Marek Daszkiewicz, Tomasz Kozłowski, Tadeusz Kryszczyński

Proc. SPIE. 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019

KEYWORDS: Wave plates, Light sources, Prisms, Interferometry, Confocal microscopy, Sensors, Fringe analysis, Optical fibers, Chemical elements, Colorimetry

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Proceedings Article | 1 October 2018 Paper

Overview of the measuring systems where a continuously altered light source plays a key role: Part I

Dariusz Litwin, Tadeusz Kryszczyński, Adam Czyżewski, Jerzy Mikucki, Jacek Galas, Marek Daszkiewicz

Proc. SPIE. 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018

KEYWORDS: Sensors, Confocal microscopy, Colorimetry, Light sources, Objectives, Mirrors, Spectroscopy, Chemical species, Optical inspection, Chromatic aberrations

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Proceedings Article | 5 October 2017 Paper

Photonic technology revolution influence on the defence area

Jacek Galas, Dariusz Litwin, Narcyz Błocki, Marek Daszkiewicz

Proc. SPIE. 10434, Electro-Optical Remote Sensing XI

KEYWORDS: Photonic integrated circuits, Defense technologies, Defense and security, Radar, Indium oxide, Defense systems, Telecommunications, Phase measurement, Analytical research, Integrated optics

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Proceedings Article | 7 August 2017 Paper

Fringe image analysis for variable wavelength interferometry

Jacek Galas, Stefan Sitarek, Dariusz Litwin, Marek Daszkiewicz

Proc. SPIE. 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017

KEYWORDS: Interferometry, Fringe analysis, Image analysis, Refractive index, Birefringence, Image processing, Optical fibers, Wave plates, Temperature metrology, Telecommunications

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Proceedings Article | 7 August 2017 Paper

Mobile environment for an emission spectrometer

Kamil Radziak, Dariusz Litwin, Jacek Galas, Anna Tyburska-Staniewska, Andrzej Ramsza

Proc. SPIE. 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017

KEYWORDS: Spectroscopy, Pollution control, Microwave radiation, Plasma, Diffraction gratings, Argon, Chemical analysis, Chemical elements, Aerosols, Electrodes, Analytical research

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Proceedings Article | 7 August 2017 Paper

Multiwavelength laser scattering tomography

Jacek Galas, Dariusz Litwin, Marek Wychowaniec, Marek Daszkiewicz, Kamil Radziak, Tomasz Kozłowski, Adam Czyżewski, Jarosław Młyńczak, Krzysztof Kopczyński, Jarosław Kisielewski, Ryszard Stępień, Stefan Sitarek

Proc. SPIE. 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017

KEYWORDS: Laser scattering, Tomography, Infrared lasers, Scattering, Opacity, Infrared spectroscopy, Spectroscopy, Light scattering, Cameras, Gallium arsenide, Crystals, Infrared cameras, Visualization, Semiconductor materials, Laser crystals

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Proceedings Article | 23 December 2016 Paper

Noise reduction in an optical emission spectrometer with rotating diffraction grating

Dariusz Litwin, Stefan Sitarek, Anna Tyburska-Staniewska, Andrzej Ramsza, Piotr Wikliński, Henryk Kowalski, Grzegorz Mazur, Janusz Rzeszut, Łukasz Dałek, Jacek Galas, Marek Daszkiewicz

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Spectroscopy, Plasma, Diffraction gratings, Microwave radiation, Denoising, Helium, Photomultipliers, Computer programming, Chemical elements, Analog electronics

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Proceedings Article | 23 December 2016 Paper

Photonics approach to traffic signs

Dariusz Litwin, Jacek Galas, Adam Czyżewski, Barbara Rymsza, Leszek Kornalewski, Tadeusz Kryszczyński, Jerzy Mikucki, Piotr Wikliński, Marek Daszkiewicz, Jacek Malasek

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Roads, Light emitting diodes, Photonics, Safety, Confocal microscopy, Projection systems, Optical components, Visibility, Light sources, Bridges

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Proceedings Article | 23 December 2016 Paper

New approach for identifying the zero-order fringe in variable wavelength interferometry

Jacek Galas, Dariusz Litwin, Marek Daszkiewicz

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Interferometry, Refractive index, Birefringence, Prisms, Interferometers, Head, Image processing, Optical fibers, Computing systems, Wave plates

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Proceedings Article | 8 December 2016 Paper

Pulse laser head with monolithic thermally bonded microchip operating at 1.5 µm wavelength

Jarosław Młyńczak, Krzysztof Kopczyński, Nabil Belghachem, Jarosław Kisielewski, Ryszard Stępień, Marek Wychowaniec, Jacek Galas, Dariusz Litwin, Adam Czyżewski

Proc. SPIE. 10159, Laser Technology 2016: Progress and Applications of Lasers

KEYWORDS: Lasers, Laser bonding, Semiconductor lasers, Pulsed laser operation, Fiber coupled lasers, Mirrors, Laser applications, Diodes, Laser development, Glasses

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Proceedings Article | 20 November 2008 Paper

Chromatic sensor-based- profilometer for the focusing mirror in the Scanning Helium Microscope

D. Litwin, J. Galas, S. Sitarek, B. Surma, B. Piatkowski

Proc. SPIE. 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Semiconducting wafers, Microscopes, Confocal microscopy, Mirrors, Helium, Head, Fourier transforms, Sensors, Silicon, Temperature metrology

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Proceedings Article | 28 December 2007 Paper

Optical measurement technology and systems in the Institute of Applied Optics

J. Galas, D. Litwin

Proc. SPIE. 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007

KEYWORDS: Indium oxide, Optical testing, Control systems, Interferometry, Imaging systems, Semiconducting wafers, Gallium arsenide, Digital image correlation, Integrated optics, Computing systems

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Proceedings Article | 28 December 2007 Paper

Silicon wafers for scanning helium microscopy

D. Litwin, J. Galas, S. Sitarek

Proc. SPIE. 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007

KEYWORDS: Semiconducting wafers, Silicon, Helium, Head, Microscopes, Confocal microscopy, Temperature metrology, Mirrors, Electrodes, Microscopy

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Proceedings Article | 16 May 2007 Paper

Symmetry descriptors for Si wafer characterisation for scanning helium atomic beam microscopy mirror

J. Galas, D. Litwin, S. Sitarek, B. Surma, B. Piatkowski

Proc. SPIE. 6584, Adaptive Optics for Laser Systems and Other Applications

KEYWORDS: Semiconducting wafers, Mirrors, Helium, Silicon, Microscopes, Electrodes, Chemical species, Crystals, 3D vision, Microscopy

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Proceedings Article | 16 May 2007 Paper

Temperature influence in confocal techniques for a silicon wafer testing

D. Litwin, J. Galas, S. Sitarek, B. Surma, B. Piatkowski, A. Miros

Proc. SPIE. 6585, Optical Sensing Technology and Applications

KEYWORDS: Semiconducting wafers, Temperature metrology, Confocal microscopy, Head, Silicon, Microscopes, Chemical species, Helium, Time metrology, Wafer testing

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Proceedings Article | 27 April 2006 Paper

Interferometric and confocal techniques for testing of silicon wafers

J. Galas, D. Litwin, S. Sitarek, B. Surma, B. Piatkowski, A. Miros

Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology

KEYWORDS: Semiconducting wafers, Confocal microscopy, Helium, Chemical species, Mirrors, Interferometry, Silicon, Scanning tunneling microscopy, Sensors, Interferometers

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Proceedings Article | 27 April 2006 Paper

Automated variable wavelength interferometry in reflected light mode

D. Litwin, J. Galas, N. Blocki

Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology

KEYWORDS: Prisms, Microscopes, Wavefronts, Interferometry, Digital image correlation, Refractive index, Polarizers, Computing systems, Optics manufacturing, Birefringence

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Proceedings Article | 12 October 2005 Paper

Measurements of the geometrical characteristics of the silicon wafer for helium microscope focusing mirror

D. Litwin, J. Galas, T. Kozlowski, S. Sitarek

Proc. SPIE. 5948, Photonics Applications in Industry and Research IV

KEYWORDS: Mirrors, Semiconducting wafers, Helium, Microscopes, Silicon, Scanning tunneling microscopy, Electrodes, Chemical species, Photonics, Atomic force microscopy

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Proceedings Article | 8 October 2005 Paper

A comparative analysis of Si wafer surface structure based on AFM and scattered light measurement techniques

D. Litwin, B. Surma, B. Piatkowski, A. Miros, J. Galas

Proc. SPIE. 5948, Photonics Applications in Industry and Research IV

KEYWORDS: Semiconducting wafers, Zoom lenses, Data centers, Silicon, Mirrors, Amplifiers, Surface finishing, Manganese, Helium, Atomic force microscopy

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Proceedings Article | 24 September 2005 Paper

Simple optical method of qualitative assessment of sperm motility: preliminary results

Agnieszka Sozanska, Krystyna Kolwas, Jacek Galas, Narcyz Blocki, Adam Czyzewski

Proc. SPIE. 5959, Medical Imaging

KEYWORDS: Microscopes, In vitro testing, Image processing, CCD cameras, Motion analysis, Visualization, Phase contrast, Statistical analysis, Data acquisition, Error analysis

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Proceedings Article | 13 June 1997 Paper

Laser scanning tomograph as the tool for investigation of semiconductor materials

Jacek Galas, Marek Daszkiewicz, Tomasz Kozlowski, Narcyz Blocki

Proc. SPIE. 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology

KEYWORDS: Light scattering, Semiconducting wafers, Infrared cameras, Semiconductor materials, Laser scanners, Scattering, Laser scattering, CCD cameras, Infrared radiation, Infrared imaging

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Proceedings Article | 1 September 1995 Paper

Optoelectronic scanning device for the observation of scattering of YAG laser light in semiconductor materials

Marek Daszkiewicz, Jacek Galas, Tomasz Kozlowski, Narcyz Blocki, Marta Pawlowska, Andrzej Hruban

Proc. SPIE. 2541, Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries

KEYWORDS: Semiconducting wafers, Infrared cameras, Light scattering, Semiconductor materials, Laser scattering, Scattering, Infrared radiation, CCD cameras, YAG lasers, Cameras

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Proceedings Article | 22 August 1995 Paper

Image information compression in the image recognition process: medical example

Jacek Galas

Proc. SPIE. 2564, Applications of Digital Image Processing XVIII

KEYWORDS: Image processing, Image compression, Bone, Medical imaging, Radon, Feature extraction, Fourier transforms, Digital imaging, Image classification, Statistical analysis

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Proceedings Article | 23 November 1994 Paper

Applications of hybrid optical methods in mineral processing control systems

Jacek Galas, Stanislaw Lenczowski, Marek Daszkiewicz

Proc. SPIE. 2249, Automated 3D and 2D Vision

KEYWORDS: Image processing, Image analysis, 3D vision, Feature extraction, Minerals, Statistical analysis, Process control, 3D image processing, Detection and tracking algorithms, Control systems

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Proceedings Article | 31 October 1994 Paper

Image processing and recognition using diffractive and digital techniques

Jacek Galas

Proc. SPIE. 1991, Diffractometry and Scatterometry

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Proceedings Article | 31 October 1994 Paper

Measurement of the diameter of wires and fibers by using CCD line-scan detector

Narcyz Blocki, Marek Daszkiewicz, Jacek Galas

Proc. SPIE. 1991, Diffractometry and Scatterometry

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SPIE Journal Paper | 1 April 1994

Construction of an image recognition process on the basis of optical Fourier diffractometry: application to degraded bone structure classification

Jacek Galas, Marek Daszkiewicz, Andrzej Sawicki, Krzysztof Godwod, Jacek Szawdyn

OE Vol. 33 Issue 04

KEYWORDS: Bone, Image processing, X-rays, X-ray imaging, Image analysis, Feature extraction, Diagnostics, Statistical analysis, Image classification, Digital imaging

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Proceedings Article | 3 September 1993 Paper

Optical Fourier diffractometry applied to degraded bone structure recognition

Jacek Galas, Krzysztof Godwod, Jacek Szawdyn, Andrzej Sawicki

Proc. SPIE. 1889, Holography, Interferometry, and Optical Pattern Recognition in Biomedicine III

KEYWORDS: Bone, Image processing, Statistical analysis, Image analysis, X-ray imaging, X-rays, Feature extraction, Sensors, Hybrid optics, Fourier transforms

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Proceedings Article | 1 December 1991 Paper

Computer-driven Fourier diffractometer

Narcyz Blocki, Marek Daszkiewicz, Jacek Galas

Proc. SPIE. 1562, Devices for Optical Processing

KEYWORDS: Diffraction, Mirrors, Signal detection, Optical signal processing, Sensors, Lenses, Image analysis, Spatial frequencies, Image segmentation, Bone

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Showing 5 of 30 publications

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