Dr. Jacek Galas Profile

Dr. Jacek Galas

Deputy Director for R&D Services at Institute of Applied Optics

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Publications (28)

PROCEEDINGS ARTICLE | October 1, 2018

Overview of the measuring systems where a continuously altered light source plays a key role: Part I

Proc. SPIE. 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018

KEYWORDS: Confocal microscopy, Chromatic aberrations, Mirrors, Light sources, Sensors, Chemical species, Spectroscopy, Optical inspection, Colorimetry, Objectives

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PROCEEDINGS ARTICLE | October 5, 2017

Photonic technology revolution influence on the defence area

Proc. SPIE. 10434, Electro-Optical Remote Sensing XI

KEYWORDS: Radar, Defense and security, Telecommunications, Integrated optics, Photonic integrated circuits, Analytical research, Phase measurement, Defense technologies, Defense systems, Indium oxide

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PROCEEDINGS ARTICLE | August 7, 2017

Multiwavelength laser scattering tomography

Proc. SPIE. 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017

KEYWORDS: Infrared cameras, Visualization, Scattering, Opacity, Cameras, Spectroscopy, Crystals, Gallium arsenide, Semiconductor materials, Light scattering, Laser scattering, Infrared lasers, Infrared spectroscopy, Tomography, Laser crystals

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PROCEEDINGS ARTICLE | August 7, 2017

Mobile environment for an emission spectrometer

Proc. SPIE. 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017

KEYWORDS: Aerosols, Argon, Electrodes, Spectroscopy, Pollution control, Chemical analysis, Analytical research, Chemical elements, Microwave radiation, Plasma, Diffraction gratings

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PROCEEDINGS ARTICLE | August 7, 2017

Fringe image analysis for variable wavelength interferometry

Proc. SPIE. 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017

KEYWORDS: Optical fibers, Refractive index, Fringe analysis, Birefringence, Image processing, Interferometry, Wave plates, Image analysis, Telecommunications, Temperature metrology

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PROCEEDINGS ARTICLE | December 23, 2016

Noise reduction in an optical emission spectrometer with rotating diffraction grating

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Spectroscopy, Denoising, Photomultipliers, Computer programming, Helium, Chemical elements, Analog electronics, Microwave radiation, Plasma, Diffraction gratings

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PROCEEDINGS ARTICLE | December 23, 2016

Photonics approach to traffic signs

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Confocal microscopy, Optical components, Light sources, Light emitting diodes, Safety, Roads, Photonics, Projection systems, Bridges, Visibility

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PROCEEDINGS ARTICLE | December 23, 2016

New approach for identifying the zero-order fringe in variable wavelength interferometry

Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Optical fibers, Refractive index, Prisms, Birefringence, Interferometers, Image processing, Computing systems, Interferometry, Wave plates, Head

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PROCEEDINGS ARTICLE | December 8, 2016

Pulse laser head with monolithic thermally bonded microchip operating at 1.5 µm wavelength

Proc. SPIE. 10159, Laser Technology 2016: Progress and Applications of Lasers

KEYWORDS: Mirrors, Lasers, Glasses, Laser applications, Laser development, Semiconductor lasers, Diodes, Pulsed laser operation, Fiber coupled lasers, Laser bonding

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PROCEEDINGS ARTICLE | November 20, 2008

Chromatic sensor-based- profilometer for the focusing mirror in the Scanning Helium Microscope

Proc. SPIE. 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Sensors, Silicon, Fourier transforms, Head, Helium, Semiconducting wafers, Temperature metrology

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PROCEEDINGS ARTICLE | December 28, 2007

Silicon wafers for scanning helium microscopy

Proc. SPIE. 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007

KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Electrodes, Microscopy, Silicon, Head, Helium, Semiconducting wafers, Temperature metrology

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PROCEEDINGS ARTICLE | December 28, 2007

Optical measurement technology and systems in the Institute of Applied Optics

Proc. SPIE. 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007

KEYWORDS: Imaging systems, Gallium arsenide, Computing systems, Interferometry, Control systems, Optical testing, Digital image correlation, Integrated optics, Semiconducting wafers, Indium oxide

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PROCEEDINGS ARTICLE | May 16, 2007

Symmetry descriptors for Si wafer characterisation for scanning helium atomic beam microscopy mirror

Proc. SPIE. 6584, Adaptive Optics for Laser Systems and Other Applications

KEYWORDS: Microscopes, Mirrors, Chemical species, Electrodes, Microscopy, Crystals, Silicon, Helium, Semiconducting wafers, 3D vision

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PROCEEDINGS ARTICLE | May 16, 2007

Temperature influence in confocal techniques for a silicon wafer testing

Proc. SPIE. 6585, Optical Sensing Technology and Applications

KEYWORDS: Confocal microscopy, Microscopes, Chemical species, Silicon, Head, Time metrology, Helium, Semiconducting wafers, Wafer testing, Temperature metrology

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PROCEEDINGS ARTICLE | April 27, 2006

Automated variable wavelength interferometry in reflected light mode

Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology

KEYWORDS: Microscopes, Refractive index, Prisms, Birefringence, Computing systems, Interferometry, Wavefronts, Polarizers, Digital image correlation, Optics manufacturing

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PROCEEDINGS ARTICLE | April 27, 2006

Interferometric and confocal techniques for testing of silicon wafers

Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology

KEYWORDS: Confocal microscopy, Mirrors, Interferometers, Sensors, Chemical species, Silicon, Interferometry, Helium, Semiconducting wafers, Scanning tunneling microscopy

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PROCEEDINGS ARTICLE | October 12, 2005

Measurements of the geometrical characteristics of the silicon wafer for helium microscope focusing mirror

Proc. SPIE. 5948, Photonics Applications in Industry and Research IV

KEYWORDS: Microscopes, Mirrors, Chemical species, Electrodes, Silicon, Atomic force microscopy, Photonics, Helium, Semiconducting wafers, Scanning tunneling microscopy

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PROCEEDINGS ARTICLE | October 8, 2005

A comparative analysis of Si wafer surface structure based on AFM and scattered light measurement techniques

Proc. SPIE. 5948, Photonics Applications in Industry and Research IV

KEYWORDS: Mirrors, Silicon, Amplifiers, Atomic force microscopy, Zoom lenses, Manganese, Helium, Data centers, Semiconducting wafers, Surface finishing

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PROCEEDINGS ARTICLE | September 24, 2005

Simple optical method of qualitative assessment of sperm motility: preliminary results

Proc. SPIE. 5959, Medical Imaging

KEYWORDS: Microscopes, Phase contrast, Statistical analysis, Visualization, Image processing, Error analysis, CCD cameras, Data acquisition, Motion analysis, In vitro testing

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PROCEEDINGS ARTICLE | June 13, 1997

Laser scanning tomograph as the tool for investigation of semiconductor materials

Proc. SPIE. 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology

KEYWORDS: Infrared cameras, Infrared imaging, Scattering, Semiconductor materials, Light scattering, Laser scattering, CCD cameras, Laser scanners, Infrared radiation, Semiconducting wafers

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PROCEEDINGS ARTICLE | September 1, 1995

Optoelectronic scanning device for the observation of scattering of YAG laser light in semiconductor materials

Proc. SPIE. 2541, Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries

KEYWORDS: Infrared cameras, Scattering, Cameras, Semiconductor materials, Light scattering, Laser scattering, CCD cameras, Infrared radiation, YAG lasers, Semiconducting wafers

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PROCEEDINGS ARTICLE | August 22, 1995

Image information compression in the image recognition process: medical example

Proc. SPIE. 2564, Applications of Digital Image Processing XVIII

KEYWORDS: Radon, Statistical analysis, Image compression, Image processing, Fourier transforms, Feature extraction, Bone, Medical imaging, Digital imaging, Image classification

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PROCEEDINGS ARTICLE | November 23, 1994

Applications of hybrid optical methods in mineral processing control systems

Proc. SPIE. 2249, Automated 3D and 2D Vision

KEYWORDS: Minerals, Statistical analysis, Detection and tracking algorithms, Image processing, Control systems, Feature extraction, Image analysis, Process control, 3D vision, 3D image processing

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PROCEEDINGS ARTICLE | October 31, 1994

Image processing and recognition using diffractive and digital techniques

Proc. SPIE. 1991, Diffractometry and Scatterometry

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PROCEEDINGS ARTICLE | October 31, 1994

Measurement of the diameter of wires and fibers by using CCD line-scan detector

Proc. SPIE. 1991, Diffractometry and Scatterometry

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SPIE Journal Paper | April 1, 1994

Construction of an image recognition process on the basis of optical Fourier diffractometry: application to degraded bone structure classification

Jacek Galas, Marek Daszkiewicz, Andrzej Sawicki, Krzysztof Godwod, Jacek Szawdyn

OE Vol. 33 Issue 04

KEYWORDS: Bone, Image processing, X-rays, X-ray imaging, Image analysis, Feature extraction, Diagnostics, Statistical analysis, Image classification, Digital imaging

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PROCEEDINGS ARTICLE | September 3, 1993

Optical Fourier diffractometry applied to degraded bone structure recognition

Proc. SPIE. 1889, Holography, Interferometry, and Optical Pattern Recognition in Biomedicine III

KEYWORDS: Statistical analysis, Sensors, Image processing, X-rays, Fourier transforms, Feature extraction, Image analysis, Bone, X-ray imaging, Hybrid optics

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PROCEEDINGS ARTICLE | December 1, 1991

Computer-driven Fourier diffractometer

Proc. SPIE. 1562, Devices for Optical Processing

KEYWORDS: Diffraction, Mirrors, Optical signal processing, Spatial frequencies, Lenses, Sensors, Image segmentation, Image analysis, Bone, Signal detection

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Showing 5 of 28 publications

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