Jack T. Sanders
Contamination Control Specialist at ATK Space Systems
SPIE Involvement:
Author
Publications (11)

PROCEEDINGS ARTICLE | September 9, 2014
Proc. SPIE. 9196, Systems Contamination: Prediction, Measurement, and Control 2014
KEYWORDS: Contamination, Aerospace engineering, Visualization, Particles, Crystals, Inspection, Space operations, Contamination control, Standards development, Virtual colonoscopy

PROCEEDINGS ARTICLE | September 8, 2010
Proc. SPIE. 7794, Optical System Contamination: Effects, Measurements, and Control 2010
KEYWORDS: Carbon, Contamination, Signal attenuation, Ultraviolet radiation, X-rays, Hydrogen, Nitrogen, Oxygen, Transmittance, Epoxies

PROCEEDINGS ARTICLE | September 2, 2008
Proc. SPIE. 7069, Optical System Contamination: Effects, Measurements, and Control 2008
KEYWORDS: Sensors, Quartz, Crystals, Nitrogen, Control systems, Humidity, Adsorption, Acoustics, Contamination control, Liquids

PROCEEDINGS ARTICLE | September 7, 2006
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Mirrors, Contamination, Aerospace engineering, Reflection, Imaging systems, Sensors, Receivers, Space operations, X-ray imaging, Temperature metrology

PROCEEDINGS ARTICLE | October 15, 2004
Proc. SPIE. 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
KEYWORDS: Reflectors, Mirrors, Contamination, Solar energy, Imaging systems, Satellites, Transform theory, Space operations, Solar sails, Temperature metrology

PROCEEDINGS ARTICLE | October 15, 2004
Proc. SPIE. 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
KEYWORDS: Carbon, Telescopes, Optical filters, Mirrors, Contamination, Signal attenuation, Ultraviolet radiation, Electrons, Extreme ultraviolet, Charge-coupled devices

Showing 5 of 11 publications
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