Dr. Jack M. A. van den Eerenbeemd
at Koninklijke Philips NV
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 June 2006
Proc. SPIE. 6282, Optical Data Storage 2006
KEYWORDS: Diffraction, Monochromatic aberrations, Refractive index, Polarization, Lens design, Near field, Wave propagation, Objectives, Liquid crystals, Geometrical optics

Proceedings Article | 22 June 2006
Proc. SPIE. 6282, Optical Data Storage 2006
KEYWORDS: Actuators, Polymers, Control systems, Scanning probe lithography, Near field, Solids, Servomechanisms, Signal detection, Tolerancing, Near field optics

Proceedings Article | 22 June 2006
Proc. SPIE. 6282, Optical Data Storage 2006
KEYWORDS: Actuators, Sensors, Polymers, Manufacturing, Control systems, Near field, Solids, Servomechanisms, Signal detection, Tolerancing

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