Dr. Jacob A. Cohen
at Applied Materials Ltd Israel
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 29, 2004
Proc. SPIE. 5378, Data Analysis and Modeling for Process Control
KEYWORDS: Sensors, Image segmentation, Particles, Electrons, Reflectivity, 3D modeling, Scanning electron microscopy, 3D vision, 3D image processing, Diffusion tensor imaging

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