Prof. Jacques-Edouard Moser
Professor at Ecole Polytechnique Federale de Lausanne
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | August 20, 2015
Proc. SPIE. 9549, Physical Chemistry of Interfaces and Nanomaterials XIV
KEYWORDS: Ultrafast phenomena, Femtosecond phenomena, Organic photovoltaics, Electrodes, Polymers, Solar cells, Molecules, Fullerenes, Electronic design automation, Absorption

PROCEEDINGS ARTICLE | September 9, 2014
Proc. SPIE. 9165, Physical Chemistry of Interfaces and Nanomaterials XIII
KEYWORDS: Femtosecond phenomena, Solar energy, Titanium dioxide, Electrodes, Luminescence, Quantum efficiency, Picosecond phenomena, Zirconium dioxide, Absorption, Oxidation

PROCEEDINGS ARTICLE | September 11, 2013
Proc. SPIE. 8811, Physical Chemistry of Interfaces and Nanomaterials XII
KEYWORDS: Femtosecond phenomena, Titanium dioxide, Spectroscopy, Solar cells, Terahertz radiation, Terahertz spectroscopy, Solid state physics, Lead, Absorption, Perovskite

PROCEEDINGS ARTICLE | August 30, 2006
Proc. SPIE. 6325, Physical Chemistry of Interfaces and Nanomaterials V
KEYWORDS: Semiconductors, Oxides, Titanium dioxide, Nanoparticles, Particles, Molecules, Bridges, Aluminum, Picosecond phenomena, Absorption

PROCEEDINGS ARTICLE | December 4, 2003
Proc. SPIE. 5223, Physical Chemistry of Interfaces and Nanomaterials II
KEYWORDS: Semiconductors, Ultrafast phenomena, Optical amplifiers, Dispersion, Spectroscopy, Molecules, Interfaces, Absorbance, Picosecond phenomena, Absorption

PROCEEDINGS ARTICLE | August 27, 1999
Proc. SPIE. 3884, In-Line Methods and Monitors for Process and Yield Improvement
KEYWORDS: Amorphous silicon, Oxides, Etching, Silicon, Scanning electron microscopy, Transmission electron microscopy, Chemical analysis, CMOS technology, Semiconducting wafers, Oxidation

Showing 5 of 6 publications
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