Dr. Jae-Hyuck Yoo
at Lawrence Livermore National Lab
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10381, Wide Bandgap Power Devices and Applications II
KEYWORDS: Aluminum nitride, Interfaces, Gallium nitride, Laser induced damage, Wide bandgap semiconductors

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Laser induced damage, Transparent conducting films, Pulsed laser operation, Microscopes, Scanning electron microscopy, Plasma, Laser energy, Reflection, Optoelectronics, Absorption

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Laser ablation, Metals, Picosecond phenomena, Silica, Data modeling, Scanning electron microscopy, Optical filtering, Aluminum, Confocal microscopy, Diffusion

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