Dr. Jae-Hyuck Yoo
at Lawrence Livermore National Lab
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10381, Wide Bandgap Power Devices and Applications II
KEYWORDS: Laser induced damage, Interfaces, Gallium nitride, Aluminum nitride, Wide bandgap semiconductors

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Microscopes, Transparent conducting films, Reflection, Laser induced damage, Laser energy, Scanning electron microscopy, Optoelectronics, Pulsed laser operation, Plasma, Absorption

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Confocal microscopy, Data modeling, Silica, Metals, Diffusion, Scanning electron microscopy, Laser ablation, Aluminum, Picosecond phenomena, Optical filtering

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