Dr. Jae-Hyun Kim
Principal Engineer at SAMSUNG SDI
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 January 2011 Paper
Proceedings Volume 7867, 78670D (2011) https://doi.org/10.1117/12.874392
KEYWORDS: Lawrencium, Image quality, Image restoration, Super resolution, Color difference, Reconstruction algorithms, Image quality standards, Statistical analysis, Visualization, Berkelium

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