Mr. Jae-Sang Hyun
at
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | July 6, 2017
OE Vol. 56 Issue 07
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

PROCEEDINGS ARTICLE | May 4, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Fringe analysis, Optical spheres, 3D modeling, Volume rendering, Projection devices

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10117, Emerging Digital Micromirror Device Based Systems and Applications IX
KEYWORDS: Signal to noise ratio, Fringe analysis, Metrology, Three dimensional sensing, Imaging systems, Calibration, Stereoscopy, 3D metrology, Micromirrors, Phase measurement, Binary data, Digital Light Processing, Phase shifts

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