Mr. Jae-Sang Hyun
at
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | July 6, 2017
OE Vol. 56 Issue 07
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

PROCEEDINGS ARTICLE | May 4, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Optical spheres, 3D modeling, Volume rendering, Fringe analysis, Projection devices

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10117, Emerging Digital Micromirror Device Based Systems and Applications IX
KEYWORDS: Binary data, Digital Light Processing, Signal to noise ratio, 3D metrology, Micromirrors, Three dimensional sensing, Imaging systems, Metrology, Fringe analysis, Phase shifts, Phase measurement, Stereoscopy, Calibration

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