Jae-Sang Hyun
Doctoral Candidate at Purdue University
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Fringe analysis, 3D image reconstruction, Cameras, Stereoscopy, 3D modeling, Phase retrieval, 3D metrology, Projection systems, Binary data, 3D image processing

SPIE Journal Paper | 6 July 2017
OE Vol. 56 Issue 07
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

Proceedings Article | 4 May 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Fringe analysis, Optical spheres, 3D modeling, Volume rendering, Projection devices

Proceedings Article | 20 February 2017
Proc. SPIE. 10117, Emerging Digital Micromirror Device Based Systems and Applications IX
KEYWORDS: Signal to noise ratio, Fringe analysis, Metrology, Three dimensional sensing, Imaging systems, Calibration, Stereoscopy, 3D metrology, Micromirrors, Phase measurement, Binary data, Digital Light Processing, Phase shifts

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