Dr. Jae Wan Kim
Principal Research Scientist at Korea Research Institute of Standards and Science
SPIE Involvement:
Conference Program Committee | Author
Publications (16)

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Spectroscopy, Silicon, Fourier transforms, Geometrical optics, Semiconducting wafers, Pulsed laser operation

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Silicon, Reliability, Semiconductor lasers, Phase measurement, Semiconducting wafers, Pulsed laser operation

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Optical microscopes, Imaging systems, Interferometers, Calibration, Digital cameras, Computer programming, CCD cameras, Tablets, Distance measurement, Aluminum

PROCEEDINGS ARTICLE | May 14, 2012
Proc. SPIE. 8379, Laser Radar Technology and Applications XVII
KEYWORDS: Light sources, Avalanche photodetectors, LIDAR, Sensors, Photodiodes, Time metrology, Distance measurement, Avalanche photodiodes, Signal detection, Standards development

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Optical components, Microscopes, Monochromatic aberrations, Point spread functions, Sensors, Calibration, Computer simulations, 3D metrology, Cylindrical lenses, Cerium

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Confocal microscopy, Light sources, Phase shifting, Interferometers, Calibration, Interferometry, Phase interferometry, Semiconductor lasers, Laser stabilization, Phase shifts

Showing 5 of 16 publications
Conference Committee Involvement (3)
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Interferometry XIV: Applications
13 August 2008 | San Diego, California, United States
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