Dr. Jaehyeon Son
at Samsung Electronics
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11500, ODS 2020: Industrial Optical Devices and Systems
KEYWORDS: Metrology, Visual process modeling, Data modeling, Sensors, Image processing, Semiconducting wafers, RGB color model, Chemical mechanical planarization, General packet radio service

Proceedings Article | 11 March 2020 Presentation
Proc. SPIE. 11249, Quantitative Phase Imaging VI
KEYWORDS: Diffraction, Holography, Super resolution, Biomedical optics, Imaging systems, Microscopy, Inspection, Image resolution, Phase retrieval, Reconstruction algorithms

Proceedings Article | 9 March 2020 Presentation
Proc. SPIE. 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII
KEYWORDS: Wafer-level optics, Semiconductors, Microscopes, Holography, Super resolution, Stereoscopy, Microscopy, Image resolution, Imaging devices, Optical semiconductors

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