Jaehyuk Lee
at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5880, Optical Diagnostics
KEYWORDS: Pulsed laser operation, Phase shifts, Laser Doppler velocimetry, Plasma display panels, Temperature metrology, Cameras, Speckle pattern, Charge-coupled devices, Beam splitters, Wavefronts

PROCEEDINGS ARTICLE | April 12, 2005
Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
KEYWORDS: Sensors, Gyroscopes, Vibrometry, Speckle pattern, Laser Doppler velocimetry, Lead, Electronics, Interferometry, Nondestructive evaluation, Velocity measurements

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