Mr. Jaehyuk Lee
at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5880, Optical Diagnostics
KEYWORDS: Beam splitters, Cameras, Wavefronts, Speckle pattern, Laser Doppler velocimetry, Charge-coupled devices, Plasma display panels, Pulsed laser operation, Temperature metrology, Phase shifts

PROCEEDINGS ARTICLE | April 12, 2005
Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
KEYWORDS: Electronics, Sensors, Interferometry, Nondestructive evaluation, Speckle pattern, Vibrometry, Laser Doppler velocimetry, Gyroscopes, Velocity measurements, Lead

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