Jaeseok Bae
at Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Mathematical modeling, Refractive index, Light sources, Interferometers, Glasses, Error analysis, Inspection, Optical interferometry, Motion measurement, Motion analysis

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Refractive index, Microfluidics, Interferometers, Silicon, Optical testing, Profilometers, Optical interferometry, Semiconducting wafers

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